Sum of Group Error Differences: A Critical Examination of Bias Evaluation in Biometric Verification and a Dual-Metric Measure

A. Elobaid, N. Ramoly, L. Younes, S. Papadopoulos, E. Ntoutsi, I. Kompatsiaris, “Sum of Group Error Differences: A Critical Examination of Bias Evaluation in Biometric Verification and a Dual-Metric Measure.”, in Proceedings of the FG 2024 ReFIP workshop.